P172 iPR Scales

P172 iPR Scales

  • Creating process refractometer scales
  • Customized scales for your product

iPR

The Schmidt + Haensch desktop software P172 enables you to create scales for your Schmidt + Haensch process refractometer. Measure the refractive index of your product and the program will automatically calculate the necessary parameters. These parameters can be exported to a file which can be saved to your process refractometer.