Total solutions to address a variety of applications

With over fifty years of experience in infrared spectroscopy and using the most advanced technology, JASCO offers the best solutions for FT-IR analysis with a complete range of application-focused FT-IR spectrometers and sampling accessories as well as a dedicated instrument control and data analysis interface.

The FT/IR-4600 and FT/IR-4700 offer the highest performance in this instrument class and has expandability for a wide variety of analytical requirements. The compact optical bench is equipped with an easy access and large-size sample compartment to accept a wide range of sampling accessories. An optional MCT detector (or other options) can also be added with in the standard instrument for high-sensitivity measurements, complementing the standard DLATGS detector. Expandable capabilities include FT-IR microscopy, IR imaging and rapid scan measurement. The near-IR or far-IR models are available as a factory option.

The FT/IR-6600, FT/IR-6700, and FT/IR-6800 offer the absolute highest level of performance in the industry with the highest signal-to-noise specifications. Designed for a wide range of critical research and development applications, each model is capable of measuring from the visible (25,000 cm-1) to the Far IR (10 cm-1).

The FT/IR-6800 is equipped with gold optical surfaces for more efficient FT-Raman analysis and rapid scan capability as standard. Step scan, and full vacuum options are available for all models.

Combining the automatic beam splitter exchange unit and the automatic window switching unit/automatic gate valve unit, a broadband range measurement of a sample can be provided without breaking the instrument vacuum conditions.

Enhance the performance and extend the use of the FT/IR-4000/6000 Series Spectrometers

Various types of single reflection ATR accessories and ATR crystals are available to obtain data for different types of samples to reduce the cost and time for infrared sample analysis.

The ATR PRO ONE is a single reflection ATR accessory using a newly designed monolithic diamond crystal to provide dramatically high optical throughput. A “torque-limiter” pressure applicator providing reproducible sample pressure contact allows excellent reproducibility for sample measurements. Available options for a ZnSe or Ge crystal kit.

The new ATR PRO ONE VIEW, the latest high-throughput ATR - diamond prism for sample measurement and observation directly through the prism able to measure samples as small as 50 to 100 μm.

The JASCO RFT-6000 FT-Raman accessory is designed for quick, non-destructive FT-Raman analysis of virtually any sample when used in conjunction with the JASCO FT/IR-6800 spectrometer.

Unlike dispersive Raman spectroscopy where spectra are normally measured using an excitation wavelength in the visible range, FT-Raman spectroscopy virtually eliminates fluorescence from the sample itself or sample impurities. FT-Raman spectroscopy also eliminates the tedious sample preparation sometimes required by FT-IR techniques. Eliminating these barriers drastically expands the potential for FT-Raman analysis to a wide variety of applications.

The near-infrared excitation of the RFT-6000 offers higher powered lasers to be used without photo degradation of the sample. The ability to co-add successive sample scans for the Fourier Transform technique compensates for the loss of sensitivity inherent to the weak Raman signals. The gold coated optical surfaces of the FT/IR-6800 enhance the sensitivity of the RFT-6000 allowing analysis of a wide variety of sample types and meeting the needs of a greater number of scientists.

A unique, single platform software package for any JASCO spectroscopy system

JASCO is the first manufacturer to develop a powerful, cross-platform software package, “Spectra Manager”, for controlling a wide range of spectroscopic instrumentation. The Spectra Manager program is a comprehensive package for capturing and processing data, eliminating the need to learn multiple software packages and offering the user a shallower learning curve.

Several types of measurement data files (UV-Vis/NIR, FT-IR, Fluorescence, etc.) can be viewed in a single window, and processed using a full range of data manipulation functions.

The latest version, Spectra Manager II, includes four measurement programs, a spectra analysis program, an instrument validation program and the JASCO Canvas program as standard. It is possible to analyze data even during sample measurements.

Spectra Manager CFR provides features to support laboratories in compliance with 21 CFR Part 11.

A choice of complete pull-down task menus, user-friendly icons, and easily accessible pop-up menus enables new users to manage security information, control user access, and record audit trails.